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Home Nanomaterials Group Thesis Modifying the AFM tip using FIB/GIS in scanning electron microscope
Bachelor thesis

Modifying the AFM tip using FIB/GIS in scanning electron microscope

The description is only in the Czech language
Supervisor

Prof. Iva Matolínová

Professor, Group leader
imatol@mbox.troja.mff.cuni.cz
+420-95155-2241
+420-95155-2252
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Consultant

Dr. Jaroslava Nováková

Researcher
jaroslava.lavkova@gmail.com
+420-95155-2252
People detail

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